Four Probe Set-up for Mapping the Resistivity of Large Samples (FP-01C)
FOUR PROBE SET-UP FOR MAPPING THE RESISTIVITY OF LARGE SAMPLES.
The Four Probe Method is one of the standard and most widely used method for the measurement of resistivity. In its useful form, the four probes are collinear. The error due to contact resistance, which is significant in the electrical measurement on semiconductors, is avoided by the use of two extra contacts (probes) between the current contacts. In this arrangement the contact resistance may all be high compare to the sample resistance, but as long as the resistance of the sample and contact resistance's are small compared with the effective resistance of the voltage measuring device (potentiometer, electrometer or electronic voltmeter), the measured value will remain unaffected.
Technical data
- Model
- FP-01C
- Manufacturer
- SVS Labs
- Horizontial
- 20 cm least count 0.001cm
- Laterial
- 6 cm least count 0.001cm
- Vertical
- 15 cm least count 0.001cm
- Used in physics and electronics laboratories for four probe set-up for mapping the resistivity of large samples-related experiments.
- Suitable for undergraduate teaching, postgraduate coursework, and research projects.
- Compact bench-top design fits standard laboratory benches and demonstration setups.
- FOUR PROBE SET-UP FOR MAPPING THE RESISTIVITY OF LARGE SAMPLES
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